1.0https://www.accscicn.com/esrich600338<blockquote class="wp-embedded-content" data-secret="qF3Z993eXd"><a href="https://www.accscicn.com/es/vision/aplicacion/app_fce10_004/">Ajuste del espesor de ferroeléctricos en películas de Al0,78Sc0,22N</a></blockquote><iframe sandbox="allow-scripts" security="restricted" src="https://www.accscicn.com/es/vision/aplicacion/app_fce10_004/embed/#?secret=qF3Z993eXd" width="600" height="338" title="«Al0.78Sc0.22N薄膜中铁电体的厚度调整» — " data-secret="qF3Z993eXd" frameborder="0" marginwidth="0" marginheight="0" scrolling="no" class="wp-embedded-content"></iframe><script> /*! This file is auto-generated */ !function(d,l){"use strict";l.querySelector&&d.addEventListener&&"undefined"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!/[^a-zA-Z0-9]/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret="'+t.secret+'"]'),o=l.querySelectorAll('blockquote[data-secret="'+t.secret+'"]'),c=new RegExp("^https?:$","i"),i=0;i<o.length;i++)o[i].style.display="none";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute("style"),"height"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):"link"===t.message&&(r=new URL(s.getAttribute("src")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener("message",d.wp.receiveEmbedMessage,!1),l.addEventListener("DOMContentLoaded",function(){for(var e,t,s=l.querySelectorAll("iframe.wp-embedded-content"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute("data-secret"))||(t=Math.random().toString(36).substring(2,12),e.src+="#?secret="+t,e.setAttribute("data-secret",t)),e.contentWindow.postMessage({message:"ready",secret:t},"*")},!1)))}(window,document); //# sourceURL=https://www.accscicn.com/wp-includes/js/wp-embed.min.js </script>https://www.accscicn.com/wp-content/uploads/2022/04/image-4.png1106485本文中主要阐述了的是已经检查了溅射沉积的无极化Al0.78Sc0.22N 薄膜的铁电性能的厚度缩放。 通过 X 射线摇摆曲线测量，用薄至 10 nm的薄膜确认了 c 轴取向的薄膜。 从电容测量中观察到铁电型滞后和无极化行为，即使厚度为 20 nm。 当厚度小于 35 nm 时，剩余极化 (Pr) 显示出逐渐退化。 开关 (SW) 循环测试揭示了薄膜的唤醒效应，特别是对于超过 35 nm的厚薄膜。